Post a New Question

chemistry

posted by .

The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe k alpha radiation. At what angle,a , do you expect to observe the first reflection of aluminum, i.e., the reflection at the lowest angle? Express your answer in degrees

  • chemistry -

    24.5

Respond to this Question

First Name
School Subject
Your Answer

Similar Questions

  1. Chemistry

    Aluminum cookware is reffered ti as "anodized aluminum". The anodizing process puts a layer of aluminum oxide on the aluminum, protecting it from corrosion. Consider the reaction of 10.00 grams of aluminum with 10.00 grams of oxygen …
  2. Chemistry

    Aluminum is more reactive than iron, yet it is used today for a variety of applications in which iron would corrode (cans, rain gutters,etc). The reason for the corrosion durability of aluminum is 1. all aluminum products are treated …
  3. chemistry

    The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect …
  4. chemistry

    The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect …
  5. chemistry

    The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect …
  6. chemestry

    The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect …
  7. Chemistry

    The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect …
  8. chemistry

    a sample of molybdenum is analysed by x-ray diffraction using Nik(alpha) radiation. calculate value of angle of which the lowest angle of radiation is observed . answer in degrees.
  9. chemistry

    the silicon wafer is coated with a layer of metallic aluminium which acts as an electrical contact.
  10. chemistry

    the silicon wafer is coated with a layer of metallic aluminium which acts as a electric contact.

More Similar Questions

Post a New Question