March 27, 2017

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Posts by ANoni

Total # Posts: 2

The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect to observe the first reflection of ...
January 12, 2013

I need the concepts!
November 17, 2012

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