Monday
March 27, 2017

Post a New Question

Posted by on .

The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect to observe the first reflection of aluminum, i.e., the reflection at the lowest angle? Express your answer in degrees.

Answer This Question

First Name:
School Subject:
Answer:

Related Questions

More Related Questions

Post a New Question