June 1, 2016

Homework Help: chemestry

Posted by ANoni on Saturday, January 12, 2013 at 7:50pm.

The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect to observe the first reflection of aluminum, i.e., the reflection at the lowest angle?


Answer This Question

First Name:
School Subject:

Related Questions

More Related Questions