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August 29, 2014

Homework Help: chemestry

Posted by ANoni on Saturday, January 12, 2013 at 7:50pm.

The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect to observe the first reflection of aluminum, i.e., the reflection at the lowest angle?

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