Post a New Question

chemistry

posted by .

The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect to observe the first reflection of aluminum, i.e., the reflection at the lowest angle? Express your answer in degrees.

  • chemistry -

    Use lamba = 2d*sin(theta)
    d is the distance between planes in Al and I don't know d. You can look up K alpha for Fe and d for Al.

  • chemistry -

    13.8

  • chemistry -

    Many thanks. I see now :)

  • chemistry -

    It's wrong.
    What's the answer?

Answer This Question

First Name
School Subject
Your Answer

Related Questions

More Related Questions

Post a New Question