Homework Help: chemistry

Posted by schoolgirl on Friday, January 11, 2013 at 1:22pm.

The silicon wafer is coated with a layer of metallic aluminum which acts as an electrical contact. The x-ray diffraction pattern of aluminum is measured in a diffractometer with Fe Kα radiation. At what angle, θ, do you expect to observe the first reflection of aluminum, i.e., the reflection at the lowest angle? Express your answer in degrees.

chemistry - DrBob222, Friday, January 11, 2013 at 3:34pm
Use lamba = 2d*sin(theta)
d is the distance between planes in Al and I don't know d. You can look up K alpha for Fe and d for Al.
chemistry - Anonymous, Friday, January 11, 2013 at 3:48pm
13.8
chemistry - schoolgirl, Saturday, January 12, 2013 at 3:26am
Many thanks. I see now :)
chemistry - Wo Ming, Saturday, January 12, 2013 at 11:38pm
It's wrong.
What's the answer?

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